| 摘要 |
The invention relates to a device for inspecting and rotating electronic components, particularly flip chips, comprising a component (14) which is rotatably mounted at a position of rotation (17) and which is used to rotate electric components. A first receiving element (19) is fixed to the outer side of the component (14) in order to receive a single electronic component of a carrier (14) and to secure it during a rotational movement (15, 16; 15a) of the component (14). A second receiving element (20) is arranged on the outer side of the component (14) opposite the first receiving element (19) in relation to the point of rotation (17) such that when the component (14) is rotated (15,16) by 180° it respectively faces the carrier (11), and a through opening (28) is arranged in the component (14) between the receiving elements (19,20) such that when the component (14) is rotated (15,16) by 90° or 270° the through opening (28) faces the carrier (11). The invention relates to a method for inspecting and rotating electronic components, particularly flipchips. |
