发明名称 |
PHOTOELECTRON MEASURING DEVICE |
摘要 |
A photoelectron measuring device capable of handling a sample in the atmosphere. The photoelectron measuring device which allows a ultraviolet ray generating device (1) to apply a ultraviolet ray to a sample (S) with its wavelength being changed and detects a wavelength at which a photoelectron is first emitted from the sample (S), wherein a portion up to an emission port (2) is kept under a non-oxygen environment, and a sample table (4) is so located as to keep the distance between the emission port (2) and the sample (S) surface at up to 7 mm.
|
申请公布号 |
KR20060122938(A) |
申请公布日期 |
2006.11.30 |
申请号 |
KR20067017346 |
申请日期 |
2006.08.28 |
申请人 |
RIKEN KEIKI CO., LTD. |
发明人 |
NAKAJIMA YOSHIYUKI;YAMASHITA DAISUKE |
分类号 |
G01N23/227;G01N23/22;G01T1/16;G21K1/06;G21K5/02 |
主分类号 |
G01N23/227 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|