发明名称 PHOTOELECTRON MEASURING DEVICE
摘要 A photoelectron measuring device capable of handling a sample in the atmosphere. The photoelectron measuring device which allows a ultraviolet ray generating device (1) to apply a ultraviolet ray to a sample (S) with its wavelength being changed and detects a wavelength at which a photoelectron is first emitted from the sample (S), wherein a portion up to an emission port (2) is kept under a non-oxygen environment, and a sample table (4) is so located as to keep the distance between the emission port (2) and the sample (S) surface at up to 7 mm.
申请公布号 KR20060122938(A) 申请公布日期 2006.11.30
申请号 KR20067017346 申请日期 2006.08.28
申请人 RIKEN KEIKI CO., LTD. 发明人 NAKAJIMA YOSHIYUKI;YAMASHITA DAISUKE
分类号 G01N23/227;G01N23/22;G01T1/16;G21K1/06;G21K5/02 主分类号 G01N23/227
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