发明名称 |
COMPOSITION FOR PHOTORESIST COATING, METHOD FOR FORMING PHOTORESIST PATTERN, AND SEMICONDUCTOR ELEMENT |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for forming a fine pattern in a semiconductor process. SOLUTION: In the method for forming the fine pattern using a composition for a photoresist coating, by coating the already formed photoresist pattern with the composition for the photoresist coating containing a water soluble polymer and an aqueous solvent, sizes of a photoresist contact hole and a space are effectively reduced. COPYRIGHT: (C)2007,JPO&INPIT |
申请公布号 |
JP2006323350(A) |
申请公布日期 |
2006.11.30 |
申请号 |
JP20060008631 |
申请日期 |
2006.01.17 |
申请人 |
HYNIX SEMICONDUCTOR INC;YOUNGCHANG CHEMICAL CO LTD |
发明人 |
LEE GEUN SU;MOON SEUNG CHAN;LEE SEUNG HUN |
分类号 |
G03F7/40;H01L21/027 |
主分类号 |
G03F7/40 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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