发明名称 Novel semiconductor device with improved channel strain effect
摘要 A semiconductor device includes a substrate, a gate structure over the substrate, a first sidewall spacer on a sidewall of the gate structure, a first diffusion region in the substrate and adjacent to the gate structure, the first sidewall spacer and the first diffusion region being on one side of the gate structure, and a first conductive layer in the first diffusion region, the first conductive layer being spaced apart from the first sidewall spacer.
申请公布号 US2006267106(A1) 申请公布日期 2006.11.30
申请号 US20050137495 申请日期 2005.05.26
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 CHAO DONALD Y.;CHEN CHIEN-HAO;YEH LING-YEN;LEE TZE-LIANG;CHEN SHIH-CHANG
分类号 H01L29/772 主分类号 H01L29/772
代理机构 代理人
主权项
地址