发明名称 Avalanchefeste MOS-Transistorstruktur
摘要 An MOS-transistor structure includes a highly doped first region (1,9) of a first conductivity type, a weakly-doped drift- region (2) of a first conductivity type bordering on the first region (1,9) and at least one body-region (3) of a second conductivity type, bordering on the drift-region (2). At least one source region (4) of a first conductivity type is embedded in the body region (3), and a gate electrode (6) is separated by a gate oxide (7) from at least one body region (3) and at least one source region (4). Starting from the first region (1,9), a highly doped region of a first conductivity type extends in the direction of the body region (3) into the drift region (2). The first region (1,9) is specifically designed as a drain region (1) and the MOS- transistor structure is specifically designed as a vertical transistor structure, or as an up-drain transistor structure.
申请公布号 DE19925880(B4) 申请公布日期 2006.11.30
申请号 DE1999125880 申请日期 1999.06.07
申请人 INFINEON TECHNOLOGIES AG 发明人 WERNER, WOLFGANG;HIRLER, FRANZ
分类号 H01L29/78;H01L21/336;H01L29/08 主分类号 H01L29/78
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