发明名称 INTERFACE, AND SEMICONDUCTOR TESTING DEVICE USING THE SAME
摘要 PROBLEM TO BE SOLVED: To easily connect and release a probe card to/from a test head connected via coaxial connectors. SOLUTION: This interface 100 provided in the test head 13 for connecting the probe card 10 to the test head 13 is provided with an interface main body 1, the coaxial connector 2 supported by the interface main body 1, and an energizing mechanism 3 supported by the interface main body 1, and for energizing the probe card 10 toward a direction of disengaging the probe card 10, whith the coaxial connector 2 engaged with the mating coaxial connector 15 provided in the probe card 10. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006322918(A) 申请公布日期 2006.11.30
申请号 JP20060024466 申请日期 2006.02.01
申请人 AGILENT TECHNOL INC 发明人 GOTO AKIHIKO
分类号 G01R31/28;G01R1/06;H01R13/635 主分类号 G01R31/28
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