| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device that is simple, excellent in productivity, compact and low in cost in structural and manufacturing aspects, and to provide a temperature detecting method for operating the semiconductor device with high accuracy. SOLUTION: A semiconductor device 10 is provided with a temperature detector 12 performing temperature detection by a semiconductor element formed on a semiconductor substrate, a temperature detector output terminal T3 provided on the semiconductor substrate for outputting the detection signal of the temperature detector 12 outside, a current generating means connected with the temperature detecting part output terminal T3 to supply driving current to the temperature detector 12, and a voltage measuring means connected with the temperature detector output terminal T3 to measure the voltage value of the temperature detector output terminal T3. In supplying the electric current of a predetermined amount to the temperature detector 12 from the current generating means, temperature detection is performed on the basis of the voltage value measured by the voltage measuring means. COPYRIGHT: (C)2007,JPO&INPIT
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