| 摘要 |
There is provided a pattern generator that generates a test pattern for testing an electronic device using test data previously supplied. The pattern generator includes a cache memory, a main memory operable to store a plurality of test data blocks of which each block is the test data of the magnitude capable of being stored on the cache memory, and an instruction memory operable to store instruction information showing sequence in which the plurality of test data blocks should be stored on the cache memory, in which the pattern generator sequentially outputs the test data blocks stored on the cache memory as the test pattern. It is preferable that the instruction memory stores the instruction information showing all sequence of the test data blocks to be stored on the cache memory in order to generate the test pattern before beginning to generate the test pattern.
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