发明名称 METHOD AND APPARATUS FOR PATTERN-BASED SYSTEM DESIGN ANALYSIS
摘要 <p>A method for analyzing a target system, where the method includes obtaining a plurality of characteristics from the target system using a characteristics extractor wherein each of the plurality of characteristics is associated with a characteristics model, storing each of the plurality of characteristics obtained from the target system in a characteristics store, and analyzing the target system by issuing at least one query to the characteristics store to obtain an analysis result.</p>
申请公布号 WO2006126989(A1) 申请公布日期 2006.11.30
申请号 WO2005US18003 申请日期 2005.05.23
申请人 SUN MICROSYSTEMS, INC.,;ALI, SYED, M.;KAMEN, YURY;ALUR, DEEPAK;CRUPI, JOHN, P.;MALKS, DANIEL, B.;KRISHNAMURTHY, RAJMOHAN;GODFREY, MICHAEL, W. 发明人 ALI, SYED, M.;KAMEN, YURY;ALUR, DEEPAK;CRUPI, JOHN, P.;MALKS, DANIEL, B.;KRISHNAMURTHY, RAJMOHAN;GODFREY, MICHAEL, W.
分类号 G06F9/44 主分类号 G06F9/44
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