A circuit and method for testing data path,申请号KR20000057120-传众专利搜索

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发明名称	A circuit and method for testing data path
摘要
申请公布号	KR100652363(B1)	申请公布日期	2006.11.30
申请号	KR20000057120	申请日期	2000.09.28
申请人		发明人
分类号	G11C29/00	主分类号	G11C29/00
代理机构		代理人
主权项
地址

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