| 摘要 |
A system for testing a Light emitting diode (LED) and connectors thereof is disclosed. The system includes: a chip ( 10 ) having General purpose input output (GPIO) function and a plurality of pins ( 101 ), a tackle ( 30 ), a parallel interface ( 40 ), and a programmable device ( 50 ). The programmable device ( 50 ) comprising: a setting module ( 501 ), a pin initializing module ( 502 ), a potential controlling module ( 503 ), a data capturing module ( 504 ), and a comparing module ( 505 ). A related method is also disclosed.
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