| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device which is provided with a probing circuit for test having no connection with its original logic functions, in addition to logic circuits for the logic function. SOLUTION: The semiconductor device has several logic circuits, and is provided with logic circuits (C11-C33) for achieving predetermined logic functions and at least one probing circuit (PB) connected with the logic circuits. The probing circuit (PB) has no connection with the predetermined logic functions, and the diffusion layer of the probing circuit is used by an LVP (Laser Voltage Probing) method. COPYRIGHT: (C)2007,JPO&INPIT
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