发明名称 Method for generating commands for testing hardware device models
摘要 Embodiments of the present invention provide a method for generating write and read commands used to test hardware device models. While generating the commands, the method keeps track of the expected state of a device model by creating one or more data structures, referred to as "nodes," within which data associated with each write command is stored. Each node also includes a data valid field that indicates which locations have been written to, and a data verified field that indicates which data has been verified since the most recent write. Accordingly, the method is able to generate multiple write commands to a location without having to generate intervening read commands to validate the data. In addition, the method enables read commands to be generated in a different sequence from the sequence of generated write commands, and having different sizes than the sizes of the write commands.
申请公布号 US2006271347(A1) 申请公布日期 2006.11.30
申请号 US20060496199 申请日期 2006.07.31
申请人 MICRON TECHNOLOGY, INC. 发明人 HOFFMAN ROBERT R.JR.
分类号 G06F9/455;G06F17/50 主分类号 G06F9/455
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