发明名称 POLISHING PAD
摘要 <P>PROBLEM TO BE SOLVED: To provide a polishing pad, hardly causing scratch on the surface of a polishing object and having excellent flattening characteristic, and a method of manufacturing a semiconductor device using the polishing pad. <P>SOLUTION: This polishing pad 1 includes a polishing layer formed of polyurethane resin foam having micro cells, wherein the polishing surface of the polishing layer has a projecting and recessed structure. The polyurethane resin foam has a tensile breaking elongation of 25 to 120%. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006320981(A) 申请公布日期 2006.11.30
申请号 JP20050144304 申请日期 2005.05.17
申请人 TOYO TIRE & RUBBER CO LTD 发明人 KAZUNO ATSUSHI;OGAWA KAZUYUKI
分类号 B24B37/20;C08G18/10;C08G101/00;H01L21/304 主分类号 B24B37/20
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