| 摘要 |
A method of inspecting an electronic circuit that includes a first integrated circuit and a second integrated circuit formed on a circuit board. The first integrated circuit has a first power source, an input circuit and a signal output section, and the second integrated circuit has a second power source, an output circuit and a signal input section. The method is comprised of steps of: changing voltage level of the first power source; applying a test signal to the signal input section; detecting an output signal of the signal output section; examining whether there is a sufficient margin in the electronic circuit by comparing the test signal and the output signal.
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