摘要 |
<p>A method for analyzing a target system (100) that includes obtaining a characteristics model (108), generating at least one selected from the group consisting of a schema, characteristics store API (104), and a characteristics extractor (102A, 102N), using the characteristics model (108), obtaining a plurality of characteristics from the target system (100) using characteristics extractor (102A, 102N), wherein each of the plurality of characteristics is associated with the characteristics model (108), storing each of the plurality of characteristics in the characteristics store (106) using the schema, and analyzing the target system (100) by issuing at least one query to the characteristics store (106) to obtain an analysis result.</p> |
申请人 |
SUN MICROSYSTEMS, INC.;ALI, SYED, M.;KAMEN, YURY;ALUR, DEEPAK;CRUPI, JOHN, P.;MALKS, DANIEL, B. |
发明人 |
ALI, SYED, M.;KAMEN, YURY;ALUR, DEEPAK;CRUPI, JOHN, P.;MALKS, DANIEL, B. |