发明名称 VERFAHREN ZUM KALIBRIEREN EINER SPEKTROSKOPIEVORRICHTUNG
摘要 The present invention provides a method of calibrating a spectroscopic device for providing a non-invasive measurement of an analyte level in a sample. The method comprises the steps of: (a) providing a plurality of calibration algorithms; (b) taking a set of non-invasive measurements on said sample with said spectroscopic device; (c) calculating a predicted set of analyte levels for each of the calibration algorithms in response to the set of non-invasive measurements, each of the predicted sets of analyte levels being characterized by a variability range, a slope, an R2 (a square of the correlation between said set of non-invasive measurements and said predicted set of analyte levels), and a standard error of prediction; and (d) selecting an appropriate calibration algorithm by using a suitability score based on the variability range, the slope, the R2 and the standard error of prediction for each of the predicted sets of analyte levels. A method of generating suitable calibration algorithms in step (a) is also provided.
申请公布号 DE60031427(D1) 申请公布日期 2006.11.30
申请号 DE2000631427 申请日期 2000.08.31
申请人 NIR DIAGNOSTICS INC. 发明人 CADELL, E.
分类号 G01N21/35;A61B5/00;A61B5/145;A61B5/1455;G01N21/27;G01N21/31 主分类号 G01N21/35
代理机构 代理人
主权项
地址