Method for determining a set of guard points and asystem for use thereof

摘要

A system for conducting integrated circuit testing (ICT) comprising an ICT test fixture, an ICT test processor and an ICT test computer program element. The ICT test computer program element allows a computer to execute a procedure for searching for the optimum set of ICT guard points, said procedure comprising formulation of a test for all available integrated circuit guard points, administering the test to all available integrated circuit guard point and collecting the respective test score of each integrated circuit guard point and short-listing of at least two of the guard points that yield the highest result from said test for use during the testing process.