| 发明名称 |
Method and apparatus for monitoring a technical installation, especially for carrying out diagnosis |
| 摘要 |
According to the invention, a temperature pattern representing a current operating situation is derived from and classified by means of measured temperature values and/or other temperature information related to the technical installation. |
| 申请公布号 |
ZA200501795(B) |
申请公布日期 |
2006.11.29 |
| 申请号 |
ZA20050001795 |
申请日期 |
2005.03.02 |
| 申请人 |
SIEMENS AKTIENGESELLSCHAFT |
发明人 |
FICK, WOLFGANG;APPEL, MIRKO;GERK, UWE |
| 分类号 |
G01K3/00;G01K7/42;G01N;G01N25/72;G05B19/00;H02H;H02H5/04 |
主分类号 |
G01K3/00 |
| 代理机构 |
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