发明名称 |
LOW DEFECT EPITAXIAL SEMICONDUCTOR SUBSTRATE HAVING GETTERING FUNCTION, IMAGE SENSOR USING THE SAME AND FABRICATION METHOD THEREOF |
摘要 |
A low defect epitaxial semiconductor substrate, an image sensor using the same and a manufacturing method thereof are provided to getter easily metallic dopants by using a non-carrier type dopant layer and to heal easily defects of the substrate by using a carrier type dopant layer. An epitaxial semiconductor substrate structure includes a semiconductor substrate(10), a carrier type dopant layer, a non-carrier type dopant layer and an epitaxial layer. The carrier type dopant layer(30) is formed in the substrate. The non-carrier type dopant layer(20) is formed in the carrier type dopant layer. The epitaxial layer(40) is formed on an upper surface of the substrate.
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申请公布号 |
KR100654354(B1) |
申请公布日期 |
2006.11.29 |
申请号 |
KR20050067451 |
申请日期 |
2005.07.25 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
UENO TETSUJI;RHEE, HWA SUNG;LEE, HO |
分类号 |
H01L21/20 |
主分类号 |
H01L21/20 |
代理机构 |
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