发明名称 LOW DEFECT EPITAXIAL SEMICONDUCTOR SUBSTRATE HAVING GETTERING FUNCTION, IMAGE SENSOR USING THE SAME AND FABRICATION METHOD THEREOF
摘要 A low defect epitaxial semiconductor substrate, an image sensor using the same and a manufacturing method thereof are provided to getter easily metallic dopants by using a non-carrier type dopant layer and to heal easily defects of the substrate by using a carrier type dopant layer. An epitaxial semiconductor substrate structure includes a semiconductor substrate(10), a carrier type dopant layer, a non-carrier type dopant layer and an epitaxial layer. The carrier type dopant layer(30) is formed in the substrate. The non-carrier type dopant layer(20) is formed in the carrier type dopant layer. The epitaxial layer(40) is formed on an upper surface of the substrate.
申请公布号 KR100654354(B1) 申请公布日期 2006.11.29
申请号 KR20050067451 申请日期 2005.07.25
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 UENO TETSUJI;RHEE, HWA SUNG;LEE, HO
分类号 H01L21/20 主分类号 H01L21/20
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