发明名称 Device for detecting degradation of a component
摘要 An apparatus for monitoring the structural integrity of a component. A monitoring structure is applied to a component that is subject to structural degradation. The monitoring structure includes an electrical conductor that becomes cracked if the component becomes structurally degraded. When the component is a ductile metal component that may be degraded by bending, the electrical conductor is formed of a brittle material that cracks when the ductile metal component is bent. When the component is a brittle ceramic heat shield wherein a crack having a critical length is of concern, the electrical conductor is located at a predetermined location wherein a critical length crack in the component will propagate into the conductor. A crack in the electrical conductor is detected with a monitoring device to indicate a degraded structural condition in the component.
申请公布号 US7141990(B2) 申请公布日期 2006.11.28
申请号 US20040516084 申请日期 2004.11.29
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 BAST ULRICH;LAMPENSCHERF STEFAN;RETTIG UWE
分类号 G01R27/08;G01N3/02;G01N3/06;G01N19/08;G01N27/20;G01N33/38 主分类号 G01R27/08
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