发明名称 |
Device for detecting degradation of a component |
摘要 |
An apparatus for monitoring the structural integrity of a component. A monitoring structure is applied to a component that is subject to structural degradation. The monitoring structure includes an electrical conductor that becomes cracked if the component becomes structurally degraded. When the component is a ductile metal component that may be degraded by bending, the electrical conductor is formed of a brittle material that cracks when the ductile metal component is bent. When the component is a brittle ceramic heat shield wherein a crack having a critical length is of concern, the electrical conductor is located at a predetermined location wherein a critical length crack in the component will propagate into the conductor. A crack in the electrical conductor is detected with a monitoring device to indicate a degraded structural condition in the component.
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申请公布号 |
US7141990(B2) |
申请公布日期 |
2006.11.28 |
申请号 |
US20040516084 |
申请日期 |
2004.11.29 |
申请人 |
SIEMENS AKTIENGESELLSCHAFT |
发明人 |
BAST ULRICH;LAMPENSCHERF STEFAN;RETTIG UWE |
分类号 |
G01R27/08;G01N3/02;G01N3/06;G01N19/08;G01N27/20;G01N33/38 |
主分类号 |
G01R27/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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