发明名称 Method for manufacturing a semiconductor device
摘要 In a method for crystallizing an amorphous silicon film by a heat treatment that is effected for a duration of about 4 hours at about 550° C. using a catalyst element for accelerating the crystallization, the quantity of the catalyst element to be introduced into the amorphous silicon is precisely controlled. A resist mask 21 is formed on the surface of an amorphous silicon film 12 provided on a glass substrate 11 , and an aqueous solution 14 , e.g., an acetate solution, containing a catalyst element such as nickel at a concentration controlled in a range of from 10 to 200 ppm (need to be adjusted) is supplied dropwise thereto. After maintaining the state for a predetermined duration of time, the entire substrate is subjected to spin drying using a spinner 15 . A thin film of crystalline silicon is finally obtained by applying heat treatment at 550° C. for a duration of 4 hours.
申请公布号 US7141461(B2) 申请公布日期 2006.11.28
申请号 US20040878687 申请日期 2004.06.29
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 OHTANI HISASHI;ADACHI HIROKI;MIYANAGA AKIHARU;TAKAYAMA TORU
分类号 H01L21/84;H01L21/20;H01L21/336;H01L21/77 主分类号 H01L21/84
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