发明名称 Lithographic apparatus, device manufacturing method, and device manufactured thereby
摘要 A lithographic apparatus is disclosed. The apparatus includes a radiation system that provides a beam of radiation, and a support structure that supports a patterning structure. The patterning structure is configured to pattern the beam of radiation according to a desired pattern. The apparatus also includes a substrate support that supports a substrate, and a projection system that projects the patterned beam onto a target portion of the substrate. The projection system includes an optical element that has a beam entry area and an optical element that has a beam exit area through each of which the patterned beam passes. The apparatus further includes a nucleated surface that is associated with the projection system on which a plurality of nucleation sites are provided. The surface is disposed away from at least one of the beam entry area and the beam exit area.
申请公布号 US7142287(B2) 申请公布日期 2006.11.28
申请号 US20060345316 申请日期 2006.02.02
申请人 ASML NETHERLANDS B.V. 发明人 KROON MARK;VAN BEEK MICHAEL CORNELIS;DIRKSEN PETER;KURT RALPH;OWEN CASSANDRA MAY
分类号 G03B27/72;G03B27/42;G03B27/54;G03F7/20 主分类号 G03B27/72
代理机构 代理人
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