| 摘要 |
A self refresh period measurement circuit of a semiconductor device is provided to improve measurement accuracy by measuring a second self refresh period indicating more stable and normal characteristics than a first self refresh period. A delay part is periodically enabled after a self refresh signal is enabled, receives and delays an oscillation signal for performing a self refresh operation, and outputs a delay oscillation signal. A period measurement start signal generation part(220) receives the self refresh signal and the oscillation signal, and generates a period measurement start signal to set a first enable time of the oscillation signal as a start time for measuring the self refresh period. A refresh period output part(230) receives the period measurement start signal and a delay oscillation signal outputted from the delay part, and generates a refresh period output signal enabled during a period from an enable time of the period measurement start signal to the first enable time of the delay oscillation signal.
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