发明名称 Phase shift mask
摘要 A phase shift mask includes a transparent substrate, a semi-dense pattern, and a dense pattern. The semi-dense pattern is formed on the transparent substrate including a plurality of phase shift regions and non-phase shift regions arranged successively. The dense pattern is formed on the transparent substrate including a plurality of non-phase shift regions, phase shift regions, and non-transparent regions.
申请公布号 US7141337(B2) 申请公布日期 2006.11.28
申请号 US20030249372 申请日期 2003.04.03
申请人 UNITED MICROELECTRONICS CORP. 发明人 LIN CHIN-LUNG;YANG CHUEN-HUEI;CHEN MING-JUI;HUNG WEN-TIEN
分类号 G01F9/00;G03F1/00;G03F9/00 主分类号 G01F9/00
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