发明名称 Apparatus and method to reduce undesirable effects caused by a fault in a memory device
摘要 A method and apparatus is provided for reducing the current in a memory device. Peripheral device control signals are translated to the wordline off voltage level, such as a negative wordline voltage. The translated signals prevent the peripheral devices from conducting current in the wordline off mode, even if a wordline-to-digitline short should occur. The control signals may include a column select signal for a column select device and an active pull-up signal for a sense amplifier, among others. Additionally, an equalization circuit having high and low resistance components is provided for the memory device. The equalization circuit limits current, even if a wordline-to-digitline short occurs.
申请公布号 US7142446(B2) 申请公布日期 2006.11.28
申请号 US20040902728 申请日期 2004.07.29
申请人 MICRON TECHNOLOGY, INC. 发明人 DERNER SCOTT J.;PORTER STEPHEN R.;GRAHAM SCOT M.;WILLIFORD ETHAN A.;DUESMAN KEVIN G.
分类号 G11C11/24 主分类号 G11C11/24
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