发明名称 Method of fabricating nano-scale resistance cross-point memory array
摘要 A method of fabricating a nano-scale resistance cross-point memory array includes preparing a silicon substrate; depositing silicon oxide on the substrate to a predetermined thickness; forming a nano-scale trench in the silicon oxide; depositing a first connection line in the trench; depositing a memory resistor layer in the trench on the first connection line; depositing a second connection line in the trench on the memory resistor layer; and completing the memory array. A cross-point memory array includes a silicon substrate; a first connection line formed on the substrate; a colossal magnetoresistive layer formed on the first connection line; a silicon nitride layer formed on a portion of the colossal magnetoresistive layer; and a second connection line formed adjacent the silicon nitride layer and on the colossal magnetoresistive layer.
申请公布号 US7141481(B2) 申请公布日期 2006.11.28
申请号 US20040909218 申请日期 2004.07.29
申请人 SHARP LABORATORIES OF AMERICA, INC. 发明人 HSU SHENG TENG;ZHUANG WEI-WEI;PAN WEI;ZHANG FENGYAN
分类号 H01L21/20;H01L27/105;G11C13/00;H01L21/8246;H01L27/115;H01L27/24;H01L43/08 主分类号 H01L21/20
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