发明名称 Using time domain reflectometry to detect mismatched cable/connector interface
摘要 A system for detecting connector compatibility with a time domain reflectometry (TDR) circuit on a peripheral device. A cable connects the peripheral device and a second peripheral device. A first connector is for mating to a second connector on the second peripheral device. The time domain reflectometry can be used to detect electrical compatibility of the first and second connectors. The first connector can be an RJ11 connector. The second connector can be an RJ45 connector. The first connector can be a plug, and the second connector can be a socket. The number of pins of the first and second connectors can be different. The first connector can be a telco connector, and the second connector can be an Ethernet connector. The TDR circuit can be part of the peripheral device diagnostics.
申请公布号 US7141986(B2) 申请公布日期 2006.11.28
申请号 US20040902870 申请日期 2004.08.02
申请人 BROADCOM CORPORATION 发明人 MUTH JAMES M.;WANG PEIQING;CATALASAN MANOLITO M.
分类号 G01R31/02 主分类号 G01R31/02
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