发明名称 Illumination system particularly for microlithography
摘要 There is provided an illumination system for microlithography with wavelengths<=193 nm. The illumination system includes a primary light source, a first optical component, a second optical component, an image plane, and an exit pupil. The first optical component transforms the primary light source into a plurality of secondary light sources that are imaged by the second optical component in the exit pupil. The first optical component includes a first optical element having a plurality of first raster elements that are imaged into the image plane producing a plurality of images being superimposed at least partially on a field in the image plane. The first raster elements that are imaged into the image plane are illuminated almost completely.
申请公布号 US7142285(B2) 申请公布日期 2006.11.28
申请号 US20030381827 申请日期 2003.08.07
申请人 CARL ZEISS SMT AG 发明人 ANTONI MARTIN;SINGER WOLFGANG;WANGLER JOHANNES
分类号 G03B27/54;G02B13/18;G02B17/00;G02B17/08;G02B19/00;G03B27/42;G03F7/20;G21K1/06;G21K5/00;G21K5/02;G21K5/04;H01L21/027 主分类号 G03B27/54
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