发明名称 |
Wafer stage position calibration method and system |
摘要 |
A method of calibrating a positioning stage includes placing a substrate on the positioning stage. The substrate has a contrast film above a portion of the substrate. At least one pattern is at a predetermined location above the substrate, corresponding to a predetermined location on the positioning stage if the positioning stage has zero offset from a registration position. A beam is applied to a position where the pattern on the substrate would be located if the positioning stage has zero offset. At least one of the group consisting of reflected, transmitted and scattered portions of the beam is measured. Whether the positioning stage has a non-zero offset is detected based on the measured portion of the beam.
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申请公布号 |
US7142314(B2) |
申请公布日期 |
2006.11.28 |
申请号 |
US20030716814 |
申请日期 |
2003.11.19 |
申请人 |
WAFERTECH, LLC |
发明人 |
NGUYEN PHONG T.;HILL STEPHEN L.;ORLOVA NADJA |
分类号 |
G01B11/14;G01B11/00;G03F7/20;G03F9/00 |
主分类号 |
G01B11/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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