发明名称 |
APPARATUS FOR POLISHING WAFER AND PROCESS FOR POLISHING WAFER |
摘要 |
An apparatus for polishing a wafer and a process for polishing a wafer are provided to reduce a wafer polishing time by simplifying a wafer polishing process. A wafer polishing apparatus polishes a wafer(W) held by a carrier plate rotating around an axis by pressing and rubbing the wafer to a polishing pad(11) which is formed at a polishing platen(12) rotating around another axis different from the axis. The polishing pad is formed with a plurality of areas including a first and a second areas having hardness different from each other. Each of the first and the second areas is formed according to a distribution and/or an area ratio corresponding to a time rate or a distance rate of the wafer passing through the first and the second areas during a polishing period.
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申请公布号 |
KR20060119763(A) |
申请公布日期 |
2006.11.24 |
申请号 |
KR20060043242 |
申请日期 |
2006.05.15 |
申请人 |
SUMCO CORPORATION |
发明人 |
HASHII TOMOHIRO;MURAYAMA KATSUHIKO;KOYATA SAKAE;TAKAISHI KAZUSHIGE |
分类号 |
H01L21/304;B24B37/20 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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