发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT AND TEST METHOD OF PRODUCT LOADING THE SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To obtain a high screening effect even for a semiconductor integrated circuit including analog circuit parts. SOLUTION: The sequence state of output voltage from each output terminal of a power amplifier containing analog circuit parts in liquid crystal driver is set in two states of a first state (staggered state) and a second state (inverse staggered state) inverse to the first state and a differential value and a reference value of the consumption current values in the two states are compared and verified. In this manner, by reversing the arrangement state of output voltage from the power amplifier, latent failure of operational amplifier as an analog circuit where source current is flowing even in normal time and the power amplifier containing the operational amplifier can be detected. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006317398(A) 申请公布日期 2006.11.24
申请号 JP20050142803 申请日期 2005.05.16
申请人 SHARP CORP 发明人 MORI MASAMI;UCHIDA REN
分类号 G01R31/316;G01R31/26 主分类号 G01R31/316
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