| 摘要 |
PROBLEM TO BE SOLVED: To provide a method for calibrating a testing system with independent topology. SOLUTION: In the testing system 100, adjustment for measurement data obtained against a device 102 during testing is performed by a topology independent calibration system (TICS) 110. The system (TICS) 110 is constituted of a system calibration manager 120 and a processor 122. The system calibration manager 120 includes an ATML compatible XML database, an S-parameter simulator as a path correction module, and a pre-distortion module. COPYRIGHT: (C)2007,JPO&INPIT
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