A method for forming a recess gate electrode is provided to simplify the process by using a photo resist pattern as an etch mask. A pad oxide film is formed on a substrate(100) having a doping region to prevent an out diffusion of impurities. A photo resist pattern is formed on the pad oxide film. The pad oxide film and the substrate are etched by using the photo resist pattern as an etch mask to form a gate trench(118). The gate trench is filled to form a gate electrode, which protrudes on the substrate. A mask pattern is formed on the substrate to expose a field region. The exposed substrate is etched by using the mask pattern as an etch mask to form a shallow trench isolation layer. An insulation film for device isolation is formed on the shallow trench isolation layer and the mask pattern to fill the shallow trench isolation layer. The insulation film is pattern to expose an upper portion of the mask pattern. The mask pattern is removed. An ion implantation process is performed to form a doping region.
申请公布号
KR20060119354(A)
申请公布日期
2006.11.24
申请号
KR20050042293
申请日期
2005.05.20
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
KIM, JIN YOUNG;YIM, JANG BIN;KWON, SANG DONG;LEE, SEONG SOO;LEE, CHAN MI;CHOI, SUNG GIL