发明名称 SEMICONDUCTOR DEVICE HAVING SHALLOW TRENCH ISOLATION STRUCTURE AND METHOD OF MANUFACTURING THE SAME
摘要 A semiconductor device having an STI structure and a manufacturing method thereof are provided to effectively suppress an HEIP and an area of an active region while providing stable device isolation characteristics. A semiconductor substrate(100) includes an upper trench(110) and a lower trench(120). The upper trench defines an active region. The lower trench is formed at a lower portion of the upper trench to communicate with the upper trench. A device isolation film(150) is formed in the upper trench and the lower trench of the semiconductor substrate. The device isolation film includes a first insulation film, a second insulation film, and a third insulation film. The first insulation film is formed in the upper trench and covers an inner wall of the upper trench in a spacer form. The second insulation film is buried in the upper trench. The third insulation film covers an inner sidewall of the lower trench.
申请公布号 KR20060119151(A) 申请公布日期 2006.11.24
申请号 KR20050041761 申请日期 2005.05.18
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, SUNG SAM;JIN, GYO YOUNG;KIM, YUN GI
分类号 H01L21/76 主分类号 H01L21/76
代理机构 代理人
主权项
地址