发明名称 |
SEMICONDUCTOR DEVICE HAVING SHALLOW TRENCH ISOLATION STRUCTURE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
A semiconductor device having an STI structure and a manufacturing method thereof are provided to effectively suppress an HEIP and an area of an active region while providing stable device isolation characteristics. A semiconductor substrate(100) includes an upper trench(110) and a lower trench(120). The upper trench defines an active region. The lower trench is formed at a lower portion of the upper trench to communicate with the upper trench. A device isolation film(150) is formed in the upper trench and the lower trench of the semiconductor substrate. The device isolation film includes a first insulation film, a second insulation film, and a third insulation film. The first insulation film is formed in the upper trench and covers an inner wall of the upper trench in a spacer form. The second insulation film is buried in the upper trench. The third insulation film covers an inner sidewall of the lower trench.
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申请公布号 |
KR20060119151(A) |
申请公布日期 |
2006.11.24 |
申请号 |
KR20050041761 |
申请日期 |
2005.05.18 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, SUNG SAM;JIN, GYO YOUNG;KIM, YUN GI |
分类号 |
H01L21/76 |
主分类号 |
H01L21/76 |
代理机构 |
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