发明名称 WAFER POLISHING APPARATUS AND METHOD FOR POLISHING WAFERS
摘要 A wafer polishing apparatus and a method for polishing wafers are provided to reduce polishing equipment and polishing materials by simplifying a wafer polishing process. A polishing pad(11) is formed on an upper surface of a polishing platen(12). A carrier plate(14) is arranged opposite to the polishing pad to rotate a wafer(W) of a holding state and press and rub the wafer to the polishing pad. An abrasive slurry supply unit(16) supplies an abrasive slurry containing an abrasive to a surface of the polishing pad. The abrasive slurry supply unit supplies the abrasive slurries having different average particle diameters of the abrasive to the surface of the polishing pad.
申请公布号 KR20060119767(A) 申请公布日期 2006.11.24
申请号 KR20060043370 申请日期 2006.05.15
申请人 SUMCO CORPORATION 发明人 HASHII TOMOHIRO;MURAYAMA KATSUHIKO;KOYATA SAKAE;TAKAISHI KAZUSHIGE
分类号 H01L21/304;B24B37/00;B24B57/02 主分类号 H01L21/304
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