发明名称 |
WAFER POLISHING APPARATUS AND METHOD FOR POLISHING WAFERS |
摘要 |
A wafer polishing apparatus and a method for polishing wafers are provided to reduce polishing equipment and polishing materials by simplifying a wafer polishing process. A polishing pad(11) is formed on an upper surface of a polishing platen(12). A carrier plate(14) is arranged opposite to the polishing pad to rotate a wafer(W) of a holding state and press and rub the wafer to the polishing pad. An abrasive slurry supply unit(16) supplies an abrasive slurry containing an abrasive to a surface of the polishing pad. The abrasive slurry supply unit supplies the abrasive slurries having different average particle diameters of the abrasive to the surface of the polishing pad.
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申请公布号 |
KR20060119767(A) |
申请公布日期 |
2006.11.24 |
申请号 |
KR20060043370 |
申请日期 |
2006.05.15 |
申请人 |
SUMCO CORPORATION |
发明人 |
HASHII TOMOHIRO;MURAYAMA KATSUHIKO;KOYATA SAKAE;TAKAISHI KAZUSHIGE |
分类号 |
H01L21/304;B24B37/00;B24B57/02 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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地址 |
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