发明名称 SENSE AMPLIFIER OVERDRIVER CONTROL CIRCUIT AND METHOD FOR CONTROLLING SENSE AMPLIFIER OF SEMICONDUCTOR DEVICE
摘要 A sense amplifier overdriver control circuit of a semiconductor memory device and a control method thereof are provided to prevent excessive increase in the voltage level of a core voltage stage due to over-driving when a bit line sense amplifier is driven at a relatively high external power supply voltage(VDD), by preventing a relatively high over-driving voltage from being outputted. A bit line sense amplifier unit senses and amplifies data loaded on a bit line. A first driving unit drives a pull-up voltage line of the bit line sense amplifier unit with a voltage on a normal driving voltage stage. A second driving unit drives the normal driving voltage stage with an over-driving voltage. An over-driving signal generation unit generates an over-driving signal defining an over-driving period in response to an active command. A level following unit(401) outputs a corresponding voltage, which linearly varies with the over-driving voltage. A voltage level detection unit(402) senses whether the over-driving voltage is higher than a predicted level in response to the corresponding voltage. A selective output unit(403) selectively outputs the over-driving signal in response to an output signal of the voltage level detection part. The second driving unit is controlled by an output signal of the selective output unit.
申请公布号 KR100652797(B1) 申请公布日期 2006.11.24
申请号 KR20050132504 申请日期 2005.12.28
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KANG, KHIL OHK
分类号 G11C7/06;G11C7/08 主分类号 G11C7/06
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