| 摘要 |
An apparatus for generating a measurement signal for measuring a self refresh period of a semiconductor memory device is provided to reduce test time, by filtering only effective section of measurement signals and outputting the filtered measurement signals. In an apparatus(100) for generating a measurement signal for measuring a self refresh period of a semiconductor memory device, a reference period generator(110) generates first and second reference period signals on the basis of a self refresh period signal. A control circuit(120) generates an output control signal, in response to the first and second reference period signals. A period measurement circuit(130) receives an external clock signal in response to the second reference period signal, and generates internal measurement signals on the basis of an external clock signal. An output circuit(140) receives the internal measurement signals, and filters only effective section of the internal measurement signals in response to the output control signal, and outputs the filtered signals to an external test apparatus(300) through output pads.
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