| 摘要 |
An apparatus and a method for testing components mounted on a circuit board are provided to determine a short between first and second electrodes by applying a pair of probes to a first signal pad and a second test pad or to a second signal pad and a first test pad. In an apparatus for testing components mounted on a circuit board, a built-in element(20) includes a plurality of terminals. At least one signal pads(208) are formed at an upper side of a multi-layer circuit board(2) for transmitting a signal corresponding to the one among the plurality of terminals, respectively. At least one test pads(218) formed at the upper part of the multi-layer circuit board(2) corresponding to the one among at least one signal pads(208) tests an electric path, extended from the one signal pad(208) to each of the at least one test pad(218), through the one terminal.
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