发明名称 OVERHEAT DETECTING CIRCUIT
摘要 PROBLEM TO BE SOLVED: To solve a problem wherein overheat detected temperatures are dispersed greatly in a conventional overheat detecting circuit. SOLUTION: This overheat detecting circuit has a current source 101 for generating a constant current I11, an overheat detecting element part 103 operated by the first current I12 generated based on the constant current I11, and for generating the first voltage based on a temperature of a semiconductor substrate, and a detection circuit part 104 operated by the second current I13 generated based on the constant current I11, for generating the second voltage corresponding to the prescribed temperature of the semiconductor substrate, and for detecting overheat based on a voltage difference between the first voltage and a reference voltage, and a voltage difference between the second voltage and the reference voltage. The voltage difference between the first voltage and the reference voltage, and the voltage difference between the second voltage and the reference voltage are increase when the constant current I11 increases, and the voltage difference between the first voltage and the reference voltage, and the voltage difference between the second voltage and the reference voltage are decrease when the constant current I11 decreases, in the overheat detecting circuit. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006317217(A) 申请公布日期 2006.11.24
申请号 JP20050138186 申请日期 2005.05.11
申请人 NEC ELECTRONICS CORP 发明人 MORI KAZUHISA
分类号 G01K7/01 主分类号 G01K7/01
代理机构 代理人
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