发明名称 Chemical vapor deposited film based on a plasma cvd method and method of forming the film
摘要 A method of forming a vapor deposited film of a silicon oxide on the surface of a substrate by holding the substrate to be treated in a plasma-treating chamber, and effecting the treatment with a chemical plasma by feeding an organosilicon compound and an oxidizing gas into the treating chamber, wherein the rate of feeding the oxidizing gas is varied while maintaining constant the rate of feeding the organosilicon compound gas into the plasma-treating chamber during the formation of the vapor deposited film. A chemical vapor deposited film is formed featuring excellent adhesiveness, softness, flexibility, oxygen-barrier property and water-barrier property.
申请公布号 US2006264044(A1) 申请公布日期 2006.11.23
申请号 US20050550897 申请日期 2005.09.27
申请人 TOYO SEIKAN KAISHA LTD 发明人 KOBAYASHI AKIRA;NAMIKI TSUNEHISA;HOSONO HIROKO;KURASHIMA HIDEO;INAGAKI HAJIME;IEKI TOSHIHIDE
分类号 H01L21/44;C23C16/02;C23C16/04;C23C16/40 主分类号 H01L21/44
代理机构 代理人
主权项
地址