发明名称 Method and apparatus for pattern-based system design analysis using a meta model
摘要 A method for analyzing a target system that includes obtaining a characteristics model, loading the characteristics model into a meta model, obtaining a plurality of characteristics from the target system using a characteristics extractor, wherein each of the plurality of characteristics is associated with the characteristics model, storing each of the plurality of characteristics obtained from the target system in a characteristics store, and analyzing the target system by issuing at least one query to the characteristics store to obtain an analysis result, wherein the issuing the at least one query comprises verifying the at least one query using the meta model.
申请公布号 US2006265699(A1) 申请公布日期 2006.11.23
申请号 US20050134021 申请日期 2005.05.20
申请人 SUN MICROSYSTEMS, INC. 发明人 ALI SYED M.;KAMEN YURY;ALUR DEEPAK;CRUPI JOHN P.;MALKS DANIEL B.;GODFREY MICHAEL W.
分类号 G06F9/45 主分类号 G06F9/45
代理机构 代理人
主权项
地址