发明名称 Instrumentation section orientation procedure takes two dimensional image of object area and recognises marking pattern
摘要 <p>An instrument section orientation procedure takes a two dimensional image of the object area, recognises shape change markings (18) on the instrument (11) section (16), images a marking pattern and arranges it against a known pattern give the section orientation.</p>
申请公布号 DE102005022901(A1) 申请公布日期 2006.11.23
申请号 DE20051022901 申请日期 2005.05.18
申请人 SIEMENS AG 发明人 BOESE, JAN;RAHN, NORBERT
分类号 A61B19/00;A61B6/02 主分类号 A61B19/00
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