发明名称 Method to chemically remove metal impurities from polycide gate sidewalls
摘要 An embodiment includes a process of forming a gate stack that acts to resist the redeposition to the semiconductive substrate of mobilized metal such as from a metal gate electrode. An embodiment also relates to a system that achieves the process. An embodiment also relates to a gate stack structure that provides a composition that resists the redeposition of metal during processing and field use.
申请公布号 US2006261500(A1) 申请公布日期 2006.11.23
申请号 US20060494844 申请日期 2006.07.28
申请人 发明人 GONZALEZ FERNANDO;POWELL DON C.
分类号 H01L21/4763;H01L21/28;H01L21/31;H01L21/3213;H01L29/49 主分类号 H01L21/4763
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