发明名称 Bank selection signal control circuit for use in semiconductor memory device, and bank selection control method
摘要 Memory bank selection control circuits and methods are provided which improve the data sensing margin for data sense amplifiers in a multi-bank semiconductor memory structure. In one aspect, a bank selection signal control circuit includes a bank switch control unit that receives memory bank selection signals and outputs corresponding memory bank selection control signals to selectively connect memory banks to a global data input/output line according to a predetermined sequence. For memory bank selected prior to a last selected memory bank in the predetermined sequence, the bank switch control unit outputs memory bank selection control signals that are enabled for a first time period P 1 , and for the last selected memory bank, the bank switch control unit outputs a memory bank selection control signal that is enabled for a second time period P 2 , wherein P 2 is greater than P 1 . A switching unit sequentially connects each selected memory bank to the global data input/output line according to the predetermined sequence, and for a predetermined period P 1 or P 2 , in response to the corresponding bank selection control signals.
申请公布号 US2006262631(A1) 申请公布日期 2006.11.23
申请号 US20050270899 申请日期 2005.11.12
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KWAK JIN-SEOK
分类号 G11C8/00 主分类号 G11C8/00
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