| 摘要 |
A chip capable of testing itself and a testing method thereof. The chip capable of testing itself is electrically connected to a processor. The chip tests itself with a testing mode. The chip comprises a first circuit, a pattern generator, a circuit to be tested, and a result generator. The first circuit is electrically connected to the processor. The pattern generator generates a test pattern by way of pseudo-random. The circuit to be tested receives a command from the processor through the first circuit and executes the command according to the test pattern to output a testing result. The result generator generates a signature result according to the testing result. Subsequently, the chip is verified by the signature result.
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