发明名称 Surface treatment of a dry-developed hard mask and surface treatment compositions used therefor
摘要 A surface treatment process includes rinsing a substrate after a dry development process to remove residual resist material prior to patterning a hard mask layer. An amorphous carbon hard mask is dry developed and thereafter, the surface treatment includes an aqueous ammonium hydroxide and hydrogen peroxide composition. While the composition acts as a solvent to the resist, the composition is selective to the amorphous carbon hard mask and the surface under the hard mask.
申请公布号 US2006263730(A1) 申请公布日期 2006.11.23
申请号 US20060494666 申请日期 2006.07.27
申请人 MICRON TECHNOLOGY, INC. 发明人 SHEA KEVIN;TOREK KEVIN
分类号 G03F7/42;G03F7/00;H01L21/311 主分类号 G03F7/42
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