发明名称 Method and apparatus for generating components for pattern-based system design analysis using a characteristics model
摘要 A method for analyzing a target system that includes obtaining a characteristics model, generating at least one selected from the group consisting of a schema, characteristics store API, and a characteristics extractor, using the characteristics model, obtaining a plurality of characteristics from the target system using characteristics extractor, wherein each of the plurality of characteristics is associated with the characteristics model, storing each of the plurality of characteristics in the characteristics store using the schema, and analyzing the target system by issuing at least one query to the characteristics store to obtain an analysis result.
申请公布号 US2006265346(A1) 申请公布日期 2006.11.23
申请号 US20050133717 申请日期 2005.05.20
申请人 SUN MICROSYSTEMS, INC. 发明人 ALI SYED M.;KAMEN YURY;ALUR DEEPAK;CRUPI JOHN P.;MALKS DANIEL B.
分类号 G06F17/30 主分类号 G06F17/30
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