| 发明名称 |
System and method for analyzing electrical failure data |
| 摘要 |
Some embodiments of the invention include system and method for performing a calculation on the data associated with a group of wafers. The system and method display a wafer map having map indicators representing calculation results from the calculation. Other embodiments are described and claimed.
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| 申请公布号 |
US2006265156(A1) |
申请公布日期 |
2006.11.23 |
| 申请号 |
US20060493716 |
申请日期 |
2006.07.26 |
| 申请人 |
MICRON TECHNOLOGY, INC. |
发明人 |
SUN XUEQING;EYOLFSON MARK;LANGWORTHY CHRIS;MAJOR KARL L. |
| 分类号 |
G01R31/00;G01R31/319;G11C29/00;G11C29/56 |
主分类号 |
G01R31/00 |
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