发明名称 Air tunnel floating gate memory cell and method for making the same
摘要 An air tunnel floating gate memory cell includes an air tunnel defined over a substrate. A first polysilicon layer (floating gate) is defined over the air tunnel. An oxide layer is disposed over the first polysilicon layer such that the oxide layer caps the first polysilicon layer and defines the sidewalls of the air tunnel. A second polysilicon layer, functioning as a word line, is defined over the oxide layer. A method for making an air tunnel floating gate memory cell is also disclosed. A sacrificial layer is formed over a substrate. A first polysilicon layer is formed over the sacrificial layer. An oxide layer is deposited over the first polysilicon layer such that the oxide layer caps the first polysilicon layer and defines the sidewalls of the sacrificial layer. A hot phosphoric acid (H<SUB>3</SUB>PO<SUB>4</SUB>) dip is used to etch away the sacrificial layer to form an air tunnel.
申请公布号 US2006261402(A1) 申请公布日期 2006.11.23
申请号 US20050134155 申请日期 2005.05.20
申请人 LUE HANG-TING;LAI ERH-KUN;HSIEH KUANG-YEU 发明人 LUE HANG-TING;LAI ERH-KUN;HSIEH KUANG-YEU
分类号 H01L29/78;H01L21/4763 主分类号 H01L29/78
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